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Tohoku Steel Co., Ltd.
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Device Products

Automatic coercive force meter (HC meter)
This device is easy to operate and can be used to measure the coercive force of products of any shape, with remarkable accuracy and reproducibility.
MR Prober
This is used to measure the magnetic properties of next-gen memory MRAM, etc. at the wafer level.

Automatic Coercive Force Meter (HC meter)

Over 160 units have been sold.

[Features]

  • This can measure products of any shape.
  • The measurement process is automatic, and the operation is amazingly simple.
    Anyone can take measurements in a short time with excellent reproducibility.
  • Operation consists only of putting a target product, and setting the range.
    Even an alarm is available to alert you of the proper range setting.
  • A lock-in amplifier is used for magnetic detection parts.
    Supersensitivity and low noise make it possible to measure the magnetic thin film for spattering.

[Usage]

  1. Inspection of soft magnetic material properties
    Plate, bars, thin film, powder
  2. Quality control for soft magnetic parts
    Solenoid valves, relays, transformers, cores for EFI, etc., card readers, audio, cores for VCR heads, etc.
  3. Understanding the impact on the manufacturing process for magnetic properties
    Heat treatment conditions, furnace dispersion, welding, pressing, caulking, cutting off, grinding, polishing, plating, etc.

[Specifications]

Measuring range 0.005 to 30 Oe or A/cm 7-range switch
Max of applied field 1850 Oe condenser discharge pulse type
Type of detection Vibration testing lock-in amplifier type
Sample size Max. H25 x W50 x L50 mm
Display resolution Digital 31/2 digits hold function included
Repeatability +/-1%/within FS (φ10 x L50 mm)
Acquisition time Approximately 15 to 30 seconds
Factory option RS232 unit for PC output
Facilities AC100V 60VA
Automatic coercimeter K-HC1000
* K-HC-1000 (English)

Fully automatic MR prober

Compatible with strong 15kOe magnetic fields (first in the world)!

[Features]

  • The magnetic properties of next-gen memory MRAM and HDD magnetic heads can be measured at wafer level.
  • Even the smallest of chips (65u) can be measured.
  • Just place a wafer in the cassette, and set the loader, then it will automatically be taken to the measurement stage. This means multiple wafers can be measured over a long period of time with no human operation necessary.

[Usage]

  • Magnetic property inspection of MRAM and HDD magnetic heads

[Specifications]

Measuring range Wafer sizes: 4, 5, 6, and 8 inches
Applied field Hmax = 240 to 1,200 [KA/m]
Measured resistance Rmin = up to 10MΩ
Measuring time tmin = minimum 2 [seconds]
Resistance measurement method Kelvin method
Measurement mode Measurements can be made in both EA and HA directions (when using quadrupole electromagnets)
No. of wafers 12 (when using double pitch cassette)
25 (when using standard pitch cassette)
Software Shot compatible graph output, analysis results chart creation
MR prober
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